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Volumn 22, Issue 3, 2002, Pages 290-293

Refractive indexes of oxidized thin films deposited by ion beam sputtering

Author keywords

Ion beam sputtering; Oxidized thin films; Refractive index

Indexed keywords

ION BEAM ASSISTED DEPOSITION; OPTICAL COMMUNICATION; OXIDES; REFRACTIVE INDEX; SPUTTER DEPOSITION;

EID: 0036519699     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (4)
  • 2
    • 0029254891 scopus 로고
    • Temperature stability of thin-film narrow-bandpass filters produced by ion-assisted deposition
    • (1995) Appl. Opt. , vol.34 , Issue.4 , pp. 667-675
    • Takashashi, H.1
  • 4
    • 0010307985 scopus 로고    scopus 로고
    • Hiprecision optical thickness monitor applied to manufacture of ultra narrow band pass filter
    • Chinese source
    • (1999) Opt. Instrum. , vol.21 , Issue.4-5 , pp. 130-136
    • Son, D.1    Kikuchi, K.2    Cai, X.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.