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Volumn 2, Issue , 2004, Pages 1165-1169

Precise behavioural modelling of high-resolution switched-capacitor delta-sigma modulators

Author keywords

Correlated Double Sampling; Delta Sigma Modulators; Nonlinearity; SIMULINK; Switched Capacitor

Indexed keywords

CORRELATED DOUBLE SAMPLING (CDS); DELTA-SIGMA MODULATORS; SIMULINK; SWITCHED CAPACITORS (SC);

EID: 4644244496     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2004.1351272     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 77950436901 scopus 로고
    • The design of sigma-delta modulation analog-to-digital converters
    • Dec.
    • B. E. Boser, and B. A. Wooley, "The Design of Sigma-Delta Modulation Analog-to-Digital Converters," IEEE JSSC, SC-22, pp. 1298-1308, Dec. 1988.
    • (1988) IEEE JSSC , vol.SC-22 , pp. 1298-1308
    • Boser, B.E.1    Wooley, B.A.2
  • 2
    • 0038005350 scopus 로고    scopus 로고
    • Behavioral modelling of switched-capacitor sigma-delta modulators
    • MARCH
    • P. Malcovati et al, "Behavioral Modelling of Switched-Capacitor Sigma-Delta Modulators," IEEE Transactions On Circuits and Systems, Vol. 50, No. 3, MARCH 2003.
    • (2003) IEEE Transactions on Circuits and Systems , vol.50 , Issue.3
    • Malcovati, P.1
  • 4
    • 0028561550 scopus 로고
    • Modeling opAmp-induced harmonic distortion for switched-capacitor SD modulator design
    • F. Medeiro et al, "Modeling OpAmp-Induced Harmonic Distortion for Switched-Capacitor SD Modulator Design," IEEE International Symposium Circuits and Systems, 1994.
    • (1994) IEEE International Symposium Circuits and Systems
    • Medeiro, F.1
  • 5
    • 0030286542 scopus 로고    scopus 로고
    • Circuit techniques for reducing the effects of op-amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization
    • Nov.
    • C. Enz, and G. C. Temes, "Circuit Techniques for Reducing the Effects of Op-Amp Imperfections: Autozeroing, Correlated Double Sampling, and Chopper Stabilization," Proc. of the IEEE, Vol. 48, No. 11, pp. 1584-1614, Nov. 1996.
    • (1996) Proc. of the IEEE , vol.48 , Issue.11 , pp. 1584-1614
    • Enz, C.1    Temes, G.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.