Nanometer scale gap made by conventional microscale fabrication: Step junction

Nano Letters

Volumn 4, Issue 9, 2004, Pages 1699-1703

  Choi, Jaewon ^a   Lee, Kangho ^a   Janes, David B ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELEMENT; GOLD; METAL;

ARTICLE; CONDUCTANCE; DEVICE; ELECTRIC CURRENT; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRODE; ELECTRON BEAM EVAPORATION; EVAPORATION; IMAGING; LIFT OFF TECHNIQUE; NANOTECHNOLOGY; OPTICAL LITHOGRAPHY; OPTICS; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; TECHNIQUE;

EID: 4644236166     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl049113x     Document Type: Article

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