Atomic-scale properties of low-index ZnO surfaces

Applied Surface Science

Volumn 237, Issue 1-4, 2004, Pages 336-342

  Diebold, Ulrike ^a   Koplitz, Lynn Vogel ^b   Dulub, Olga ^a  

^a Tulane University   (United States)

^b LOYOLA UNIVERSITY   (United States)

Author keywords

Morphology; Roughness; Scanning tunneling microscopy; Surface structure; Topography; Zinc oxide

Indexed keywords

CATALYSIS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; SURFACE STRUCTURE; ZINC OXIDE;

FIRST PRINCIPLES TOTAL ENERGY CALCULATIONS; HOMOEPITAXIAL FILMS; WIDE BAND GAP SEMICONDUCTORS;

SURFACE REACTIONS;

EID: 4644221821     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(04)00985-7     Document Type: Conference Paper

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