Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)2 based solar cells

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 7021-7025

  Izquierdo, V ^a   Perez Rodriguez A ^a   Calvo Barrio, L ^a,b   Alvarez Garcia J ^c   Morante, J R ^a   Bermudez, V ^d   Ramdani, O ^d   Kurdi, J ^d   Grand, P P ^d   Parissi, L ^d   Kerrec, O ^d  

^a UNIVERSITY OF BARCELONA   (Spain)

^b UNIVERSITY OF BARCELONA   (Spain)

^c Centre de Recerca i Investigacio de Catalunya CRIC   (Spain)

^d 6 quai Watier   (France)

Author keywords

Chalcopyrites; CuIn(S,Se)2; Raman scattering; Solar cells

Indexed keywords

COPPER PLATING; CUSTOMER SATISFACTION; INDUSTRIAL ENGINEERING; MARKETING; PROBLEM SOLVING; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCATTERING; SELENIUM; TOTAL QUALITY MANAGEMENT;

DEVICE-QUALITY; SCATTERING ANALYSIS;

QUALITY CONTROL;

EID: 45949105887     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.068     Document Type: Article

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