Raman spectroscopy for quality control and process optimization of chalcopyrite thin films and devices

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 5913-5916

  Palm, J ^a   Jost, S ^b   Hock, R ^b   Probst, V ^a  

^a SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Chalcopyrites; CIS; Raman; Thin films; X ray diffraction

Indexed keywords

OPTIMIZATION; PROCESS MONITORING; QUALITY CONTROL; RAMAN SPECTROSCOPY; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

CHALCOPYRITES; INTENSITY RATIO; X-RAY FLORESCENCE (XRF);

THIN FILMS;

EID: 34247328933     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.162     Document Type: Article

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