Selective energy contacts for hot carrier solar cells

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 6968-6973

  Conibeer, G J ^a   Jiang, C W ^a   Konig D ^a   Shrestha, S ^a   Walsh, T ^a   Green, M A ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Hot carriers; Quantum dots; Resonant tunnelling

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CIVIL AVIATION; CRYSTAL ATOMIC STRUCTURE; DIRECT ENERGY CONVERSION; HOT CARRIERS; IMAGING TECHNIQUES; METALLIZING; MICROSCOPIC EXAMINATION; OPTICAL MICROSCOPY; OPTICAL WAVEGUIDES; PHOTOEXCITATION; QUANTUM ELECTRONICS; SCANNING PROBE MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SILICON; SILICON COMPOUNDS; TELEMETERING SYSTEMS; THICK FILMS; THIN FILMS;

CARRIER (CO); CONDUCTIVE ATOMIC FORCE MICROSCOPY (C AFM); CURRENT-VOLTAGE (C-V) MEASUREMENTS; DOUBLE BARRIERS; OPTICAL EXCITATIONS; PHOTON ENERGIES; PROOF-OF-CONCEPT (POC); QUANTUM DOT (CO); RESONANT ENERGY; RESONANT STRUCTURES; RESONANT TUNNELLING STRUCTURES; SI QUANTUM DOTS; SOLID STATE PRECIPITATION; THIN-FILM DEPOSITIONS; WIDE-RANGE;

SOLAR ENERGY;

EID: 45849147029     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.031     Document Type: Article

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