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Volumn 34, Issue 1-2, 2003, Pages 87-105

Polarized neutron reflectometry on lithographically patterned thin film structures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; LATTICE CONSTANTS; MAGNETIC FIELDS; MAGNETIC FILMS; MAGNETIZATION; MULTILAYERS; NANOSTRUCTURED MATERIALS; NEUTRON REFLECTION;

EID: 10844276618     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2004.02.013     Document Type: Conference Paper
Times cited : (13)

References (50)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.