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Volumn 602, Issue 13, 2008, Pages 2232-2237
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Imaging of electronic structure of lead phthalocyanine films studied by combined use of PEEM and Micro-UPS
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Author keywords
Electronic structure; Organic semiconductor; Photoelectron yield curve; Photoemission electron microscopy (PEEM); Phthalocyanine; Thin film growth; Ultraviolet photoelectron spectroscopy (UPS); Work function
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Indexed keywords
CARBON;
COATING TECHNIQUES;
ELECTRON MICROSCOPY;
ELECTRON OPTICS;
ELECTRONIC PROPERTIES;
ELECTRONIC STRUCTURE;
ELECTRONS;
EMISSION SPECTROSCOPY;
FILM THICKNESS;
GRAPHITE;
IMAGING TECHNIQUES;
LANDFORMS;
LASER BEAMS;
LEAD;
MICROFLUIDICS;
MICROSCOPIC EXAMINATION;
MOLECULAR BEAM EPITAXY;
MOLECULAR STRUCTURE;
MOLECULES;
PHOTOELECTRICITY;
PHOTOEMISSION;
POWER SUPPLY CIRCUITS;
PULSED LASER DEPOSITION;
THICK FILMS;
THIN FILMS;
ULTRAVIOLET SPECTROSCOPY;
UNINTERRUPTIBLE POWER SYSTEMS;
ANNEALED FILMS;
AS-DEPOSITED FILMS;
BI LAYERS;
COMPLEMENTARY METHODS;
ELSEVIER (CO);
GRAPHITE SUBSTRATES;
IN-HOMOGENEITY;
LEAD PHTHALOCYANINE;
PHOTO EMISSION ELECTRON MICROSCOPY (PEEM);
PHOTOELECTRON YIELDS;
THIN FILM GROWTH;
ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (UPS);
UNIFORM FILMS;
UV LASER RADIATION;
VACUUM LEVELS;
FILM GROWTH;
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EID: 45849105187
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2008.04.037 Document Type: Article |
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Times cited : (26)
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References (16)
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