Instance generation for SAT-based ATPG

Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

Volumn , Issue , 2007, Pages 153-156

  Tille, Daniel ^a   Fey, Görschwin ^a   Drechsler, Rolf ^a  

^a UNIVERSITY OF BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; ELECTRON TUBES; NETWORKS (CIRCUITS); TESTING;

ATPG TOOLS; AUTOMATIC TEST-PATTERN GENERATION (ATPG); BOOLEAN SATISFIABILITY (SAT); CLASSICAL APPROACHES; CONJUNCTIVE NORMAL FORM (CNF); ELECTRONIC CIRCUITS; EXPERIMENTAL RESULTS; INDUSTRIAL CIRCUITS; SATISFIABILITY (SAT) SOLVERS;

BOOLEAN FUNCTIONS;

EID: 45849086396     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DDECS.2007.4295272     Document Type: Conference Paper

References (13)

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