PASSAT: Efficient SAT-based test pattern generation for industrial circuits

Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI

Volumn , Issue , 2005, Pages 212-217

  Shi, Junhao ^a   Fey, Görschwin ^a   Drechsler, Rolf ^a   Glowatz, Andreas ^b   Hapke, Friedrich ^b   Schlöffel, Jürgen ^b  

^a UNIVERSITY OF BREMEN   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATION; BOOLEAN ALGEBRA; HEURISTIC METHODS; NETWORKS (CIRCUITS); ROBUSTNESS (CONTROL SYSTEMS);

AUTOMATIC TEST PATTERN GENERATION (ATPG); INDUSTRIAL CIRCUITS; PROBLEM FORMULATING; SEARCH ALGORITHMS;

EQUIPMENT TESTING;

EID: 26844504869     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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