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Volumn 571-572, Issue , 2008, Pages 207-212

Diffraction contrast tomography - A synchrotron radiation technique for mapping polycrystalline microstructures in 3D

Author keywords

3DXRD; Diffraction contrast tomography; Graintracking; Orientation mapping

Indexed keywords

ALUMINUM COATED STEEL; ALUMINUM METALLOGRAPHY; MAPPING; NEUTRONS; SYNCHROTRON RADIATION; SYNCHROTRONS; TOMOGRAPHY; X RAY DIFFRACTION;

EID: 45749125251     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.571-572.207     Document Type: Conference Paper
Times cited : (8)

References (13)
  • 7
    • 85000313967 scopus 로고    scopus 로고
    • H.F. Poulsen: Three-Dimensional X-Ray Diffraction Microscopy (Springer Tracts in Modern Physics, Springer-Verlag, Berlin, 2004)
    • H.F. Poulsen: Three-Dimensional X-Ray Diffraction Microscopy (Springer Tracts in Modern Physics, Springer-Verlag, Berlin, 2004)
  • 8
    • 0003847477 scopus 로고    scopus 로고
    • edited by J. Baruchel, J.Y. Buffière, E. Maire, P. Merle, and G. Peix, Hermes Science Pubs, Paris
    • X-Ray Tomography in Materials Science, edited by J. Baruchel, J.Y. Buffière, E. Maire, P. Merle, and G. Peix, Hermes Science Pubs., Paris, (2000)
    • (2000) X-Ray Tomography in Materials Science
  • 11
    • 85000296278 scopus 로고    scopus 로고
    • O. Rodrigues: J. des Math. Pures. App. 5 (1840), p. 380
    • O. Rodrigues: J. des Math. Pures. App. Vol 5 (1840), p. 380


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.