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Volumn 29, Issue 6, 2008, Pages

Systematic errors of EIT systems determined by easily-scalable resistive phantoms

Author keywords

Bioimpedance; EIT system; Measurement error; Noise performance; Phantom

Indexed keywords

DIGITAL STORAGE; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRODES; SIGNAL TO NOISE RATIO; STOCHASTIC SYSTEMS; SYSTEMATIC ERRORS;

EID: 45749107554     PISSN: 09673334     EISSN: 13616579     Source Type: Journal    
DOI: 10.1088/0967-3334/29/6/S14     Document Type: Article
Times cited : (27)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.