IMFP measurements near Au-Ni alloy surfaces by EPES: Indirect evidence of submonolayer Au surface enrichment

Surface Science

Volumn 566-568, Issue 1-3 PART 2, 2004, Pages 856-861

  Krawczyk, M ^a   Zommer, L ^a   Sobczak, J W ^a   Jablonski, A ^a   Petit, M ^b   Robert Goumet, C ^b   Gruzza, B ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b LASMEA   (France)

Author keywords

Alloys; Auger electron spectroscopy; Electron solid interactions; Gold; Monte Carlo simulations; Nickel; Surface segregation; X ray photoelectron spectroscopy

Indexed keywords

ALGORITHMS; ANNEALING; AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; CONTAMINATION; ERROR ANALYSIS; MONTE CARLO METHODS; NICKEL ALLOYS; PARAMETER ESTIMATION; STOICHIOMETRY; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC PEAK ELECTRON SPECTROSCOPY; ELECTRON-SOLID INTERACTIONS; MONTE CARLO SIMULATIONS; SURFACE SEGREGATION;

GOLD ALLOYS;

EID: 4544341837     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.021     Document Type: Article

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