Chromatic confocal microscopy with a finite pinhole size

Optics Letters

Volumn 29, Issue 18, 2004, Pages 2130-2132

  Ruprecht, A K ^a   Wiesendanger, T F ^a   Tiziani, H J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMATIC CONFOCAL MICROSCOPY; NUMERICAL APERTURE (NA); SIGNAL AMPLITUDES; SIGNAL INTENSITIES;

ELECTROMAGNETIC DISPERSION; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; LIGHT SOURCES; SIGNAL PROCESSING;

OPTICAL MICROSCOPY;

ARTICLE; COMPARATIVE STUDY; CONFOCAL MICROSCOPY; EVALUATION; INSTRUMENTATION; METHODOLOGY; OPTICS; SPECTROSCOPY; VALIDATION STUDY;

MICROSCOPY, CONFOCAL; OPTICS; SPECTRUM ANALYSIS;

EID: 4544335035     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.29.002130     Document Type: Article

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