Testability issues in superconductor electronics

Proceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications

Volumn , Issue , 2004, Pages 9-14

  Kerkhoff, Hans G ^a   Joseph, Arun A ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT-ORIENTED TESTING (DOT); ELECTRONIC DEVICES; SINGLE-FLUX QUANTUM PULSES; SUPERCONDUCTOR ELECTRONICS (SCE);

BUILT-IN SELF TEST; COMPUTER SIMULATION; ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; PROBABILITY DENSITY FUNCTION; SCANNING ELECTRON MICROSCOPY; STRUCTURAL DESIGN; SUPERCONDUCTING MATERIALS;

TELECOMMUNICATION SYSTEMS;

EID: 4544310845     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DELTA.2004.10043     Document Type: Conference Paper

References (16)

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