Defect-oriented testing of Josephson logic circuits and systems

Physica C: Superconductivity and its Applications

Volumn 350, Issue 3-4, 2001, Pages 261-268

  Kerkhoff, H G ^a   Speek, H ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPUTER SIMULATION; INDUCTANCE MEASUREMENT; LOGIC CIRCUITS; MATHEMATICAL MODELS;

DEFECT-ORIENTED TESTING; INDUCTIVE FAULT ANALYSIS; JOSEPHSON LOGIC CIRCUITS;

JOSEPHSON JUNCTION DEVICES;

EID: 0034817661     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01611-7     Document Type: Article

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