High-resolution EELS and ab initio study of the oxygen K edges in bulk perovskites

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 852-853

  Radtke, G ^a   Botton, G A ^a,b  

^a MCMASTER UNIVERSITY   (Canada)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544290857     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760488735X     Document Type: Conference Paper

References (10)

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2. S. Lazar et al., Ultramicroscopy 96, (2003) 535.
3. P. Blaha et al., Wien2k, An Augmented Plane Wave + Local Orbitals Program for Calculating Crystal Properties, (Karlheinz Schwarz, Techn. Universitat Wien, Austria), 2001.
4. C. Hebert-Souche et al., Ultramicroscopy 83, (2000) 9.
5. M. Domke et al., Chem. Phys. Lett. 173, (1990) 122.
6. P. J. Weijs et al., Phys. Rev. B 41, (1990) 11899.
7. D. A. Muller et al., Phys. Rev. B 57, (1998) 8181.
8. F. M. F. de Groot et al., Phys. Rev. B 48, (1993) 2074.
9. K. van Benthem et al., Ultramicroscopy 96, (2003) 509.
10. We are grateful to Prof. H. W. Zandbergen and to the NWO (Dutch Government) for access to the HREELS system and funding a visiting Professorship at TU Delft.