Early failure signatures of 1310 nm laser modules using electrical, optical and spectral measurements

Measurement: Journal of the International Measurement Confederation

Volumn 34, Issue 2, 2003, Pages 157-178

  Deshayes, Y ^a   Bechou, L ^a   Mendizabal, L ^a   Danto, Y ^a  

^a UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

Electro optical characterizations; Failure modes; Laser modules; Reliability

Indexed keywords

FAILURE ANALYSIS; SEMICONDUCTOR LASERS; THERMAL CYCLING;

LASER MODULES;

ELECTROOPTICAL DEVICES;

EID: 0038824985     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(03)00031-9     Document Type: Article

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