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Materials Transactions

Volumn 45, Issue 7, 2004, Pages 1994-1997

X-ray fluorescence holography study on Si1-xGex single crystal

(4) Hayashi, Kouichi a Takahashi, Yukio b Yonenaga, Ichiro a Matsubara, Eiichiro a

a TOHOKU UNIVERSITY (Japan)

b TOHOKU UNIVERSITY (Japan)

Author keywords

Local atomic structure; Silicon germanium; Single crystal; X ray fluorescence holography

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRONIC STRUCTURE; FLUORESCENCE; HOLOGRAMS; SILICON COMPOUNDS; STORAGE RINGS; X RAY ANALYSIS;

ATOMIC IMAGES; LOCAL ATOMIC STRUCTURE; X-RAY FLUORESCENCE HOLOGRAPHY;

SINGLE CRYSTALS;

EID: 4544237560 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.45.1994 Document Type: Conference Paper

Times cited : (13)

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