Scanning probe microscopy study of grain boundary migration in nial

Acta Materialia

Volumn 52, Issue 17, 2004, Pages 4953-4959

  Rabkin, Eugen ^a   Amouyal, Yaron ^a   Klinger, Leonid ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Grain boundaries; Grain boundary migration; Scanning probe microscopy

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; HIGH TEMPERATURE EFFECTS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

CAPILLARY FORCES; GRAIN BOUNDARY MIGRATION; SCANNING PROBE MICROSCOPY (SPM); SCANNING TUNNELING MICROSCOPY (STM);

NICKEL COMPOUNDS;

EID: 4544232031     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.06.027     Document Type: Article

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