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Volumn , Issue , 2004, Pages 72-73

Vertical floating-gate 4.5F2 split-gate NOR flash memory at 110nm node

Author keywords

Flash memory; Self aligned; Vertical channel

Indexed keywords

APPROXIMATION THEORY; BALLISTICS; COMPUTER SIMULATION; ELECTRIC FIELDS; LITHOGRAPHY; MOSFET DEVICES; POLYSILICON; THRESHOLD VOLTAGE; TRANSISTORS;

EID: 4544224758     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (5)
  • 2
    • 0033701271 scopus 로고    scopus 로고
    • 0.1um modular triple self-aligned embedded splitgate flash memory
    • R. Mill et al., "0.1um modular triple self-aligned embedded splitgate flash memory," Symp. VLSI Tech., p. 120 (2000)
    • (2000) Symp. VLSI Tech. , pp. 120
    • Mill, R.1
  • 3
    • 0035716640 scopus 로고    scopus 로고
    • A 130nm generation high-density Etox™ flash memory technology
    • S. Keeney, "A 130nm generation high-density Etox™ flash memory technology," IEDM Tech. Dig. p. 41 (2001)
    • (2001) IEDM Tech. Dig. , pp. 41
    • Keeney, S.1
  • 4
    • 0035715086 scopus 로고    scopus 로고
    • Highly manufacturable 1Gb NAND flash using 0.12μm process technology
    • J.D. Choi et al., "Highly manufacturable 1Gb NAND flash using 0.12μm process technology," IEDM Tech. Dig. p. 25 (2001)
    • (2001) IEDM Tech. Dig. , pp. 25
    • Choi, J.D.1
  • 5
    • 0032599208 scopus 로고    scopus 로고
    • A new self-convergent programming and erase tightening by substrate-hot-electron injection for ETOX cells in triple-well
    • M.H. Chi, C.M. Chen, C.W. Hung, and Y.H. Wang, "A new self-convergent programming and erase tightening by substrate-hot-electron injection for ETOX cells in triple-well," Symp. VLSI Tech., p. 199 (1999)
    • (1999) Symp. VLSI Tech. , pp. 199
    • Chi, M.H.1    Chen, C.M.2    Hung, C.W.3    Wang, Y.H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.