Structural analysis of Cd-Te-O films prepared by RF reactive sputtering

Journal of Non-Crystalline Solids

Volumn 354, Issue 31, 2008, Pages 3756-3761

  Caballero Briones, F ^a   Pena J L ^b   Martel, A ^c   Iribarren, A ^e   Calzadilla, O ^e   Jimenez Sandoval S ^d   Zapata Navarro, Á ^a  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

^c UNIVERSIDAD AUTÓNOMA DE YUCATÁN   (Mexico)

^d DEPARTAMENTO DE FÍSICA   (Mexico)

^e UNIVERSITY OF HAVANA   (Cuba)

Author keywords

II VI semiconductors; Microcrystallinity; Optical spectroscopy; Raman scattering; Raman spectroscopy; Short range order; Sputtering; Tellurites; X ray diffraction

Indexed keywords

CADMIUM COMPOUNDS; CRYSTALLINE MATERIALS; EMISSION SPECTROSCOPY; FILM GROWTH; OPACITY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REACTIVE SPUTTERING; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

MICROCRYSTALLINITY; SHORT RANGE ORDER; TELLURITES;

THIN FILMS;

EID: 45049087729     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.03.042     Document Type: Article

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