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Volumn 366, Issue 1-2, 2000, Pages 82-87
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Preparation and characterization of CdTeO3 thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ANNEALING;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
FILM PREPARATION;
OPTICAL VARIABLES MEASUREMENT;
PERMITTIVITY;
SEMICONDUCTING CADMIUM TELLURIDE;
SPUTTER DEPOSITION;
STOICHIOMETRY;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CADMIUM TELLURIDE OXIDE FILM;
OPTICAL CONSTANT;
OPTICAL TRANSMISSION MEASUREMENT;
THIN FILMS;
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EID: 0034188393
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)00741-0 Document Type: Article |
Times cited : (21)
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References (33)
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