메뉴 건너뛰기




Volumn 366, Issue 1-2, 2000, Pages 82-87

Preparation and characterization of CdTeO3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY OF SOLIDS; FILM PREPARATION; OPTICAL VARIABLES MEASUREMENT; PERMITTIVITY; SEMICONDUCTING CADMIUM TELLURIDE; SPUTTER DEPOSITION; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0034188393     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00741-0     Document Type: Article
Times cited : (21)

References (33)
  • 32
    • 85031559385 scopus 로고
    • 36-889 PDF sheets, JCPDS-ICDD
    • 36-889 PDF sheets, JCPDS-ICDD, 1994.
    • (1994)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.