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Volumn 254, Issue 19, 2008, Pages 6277-6280
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Characterization of soft-X-ray detectors fabricated with high-quality CVD diamond thin films
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Author keywords
Detectors; Diamond film; Electrical properties characterization; Plasma CVD
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Indexed keywords
DETECTORS;
DIAMOND FILMS;
FABRICATION;
MICROWAVE DEVICES;
MICROWAVES;
PHOTONS;
PLASMA CVD;
THIN FILMS;
TITANIUM COMPOUNDS;
X RAY APPARATUS;
X RAYS;
AMPLIFICATION MECHANISM;
APPLIED MAGNETIC FIELDS;
DETECTOR PERFORMANCE;
ELECTRICAL PROPERTIES CHARACTERIZATION;
HIGH POWER MICROWAVES;
HOMOEPITAXIAL DIAMOND LAYERS;
HOMOEPITAXIAL GROWTH;
SOFT X-RAY DETECTORS;
X RAY DETECTORS;
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EID: 45049086012
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.02.156 Document Type: Article |
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Times cited : (16)
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References (10)
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