Some aspects of pulsed laser deposited nanocrystalline LaB6 film: Atomic force microscopy, constant force current imaging and field emission investigations

Nanotechnology

Volumn 19, Issue 26, 2008, Pages

  Late, Dattatray J ^a   Date, Kalyani S ^a   More, Mahendra A ^a   Misra, Pankaj ^b   Singh, B N ^b   Kukreja, Lalit M ^b   Dharmadhikari, C V ^a   Joag, Dilip S ^a  

^a UNIVERSITY OF PUNE   (India)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

LANTHANUM COMPOUNDS; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION;

LANTHANUM HEXABORIDE; NANO CRYSTALLINE; PULSED LASERS;

NANOSTRUCTURED MATERIALS;

LANTHANUM; LANTHANUM HEXABORIDE; MOLYBDENUM; NANOCRYSTAL; NANOFILM; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLIZATION; DIODE; FIELD EMISSION; FOIL; FORCE; LASER; LINEAR SYSTEM; PRIORITY JOURNAL; QUANTUM MECHANICS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; X RAY DIFFRACTION;

EID: 44949243924     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/26/265605     Document Type: Article

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