Field emission studies of pulsed laser deposited LaB6 films on W and Re

Ultramicroscopy

Volumn 107, Issue 9, 2007, Pages 825-832

  Late, Dattatray J ^a   More, Mahendra A ^a   Misra, Pankaj ^b   Singh, B N ^b   Kukreja, Lalit M ^b   Joag, Dilip S ^a  

^a DST Unit on Nanoscience   (India)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Field emission; Pulsed laser deposition and LaB6

Indexed keywords

CRYSTALLINE MATERIALS; FILM GROWTH; GRAIN SIZE AND SHAPE; ION BOMBARDMENT; PULSED LASER DEPOSITION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EMITTERS; FOWLER NORDHEIM PLOTS; LANTHANUM HEXABORIDE; STRUCTURAL STABILITY;

LANTHANUM COMPOUNDS;

ION; LANTHANUM; RHENIUM; TUNGSTEN;

ARTICLE; DIODE; FIELD EMISSION; FILM; LASER; NANOANALYSIS; X RAY DIFFRACTION;

EID: 34248998125     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.02.014     Document Type: Article

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