Impact of source to drain tunneling on the Ion/Ioff trade-off of alternative channel material MOSFETs

2007 International Semiconductor Device Research Symposium, ISDRS

Volumn , Issue , 2007, Pages

  Rafhay, Quentin ^a   Clerc, Raphaël ^a   Ghibaudo, Gérard ^a   Pananakakis, Georges ^a  

^a IMEP LAHC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44949238670     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISDRS.2007.4422479     Document Type: Conference Paper

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