Determination of thickness and composition of thin films by x-ray fluorescence spectrometry using theoretical influence coefficient algorithms

X-Ray Spectrometry

Volumn 37, Issue 3, 2008, Pages 265-272

  Sitko, Rafał ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CHROMIUM ALLOYS; FILM THICKNESS; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; IRON ALLOYS; MATRIX ALGEBRA; TERNARY ALLOYS;

ANALYTES; COMPLEX FUNCTIONS; FILM-THICKNESS; FLUORESCENCE RADIATIONS; INFLUENCE COEFFICIENT; MATRIX COMPOSITION; RADIATION INTENSITY; THIN-FILMS; X RAY FLUORESCENCE; X RAY FLUORESCENCE SPECTROMETRY;

THIN FILMS;

EID: 44949095715     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1012     Document Type: Article

References (19)

1. Laguitton D, Mantler M. Adv. X-Ray Anal. 1977; 20: 515.
2. Laguitton D, Parrish W. Anal. Chem. 1977; 49:1152.
3. Mantler M. Adv. X-Ray Anal. 1984; 27: 433.
4. Van Dyck PM, Török SB, Van Grieken RE. Anal. Chem. 1986; 58: 1761.
5. Kataoka Y, Arai T. Adv. X-Ray Anal. 1990; 33: 213.
6. Kataoka Y, Arai T. Adv. X-Ray Anal. 1990; 33: 225.
7. Huang TC. X-ray Spectrom. 1991; 20: 29.
8. Wang Y. X-ray Spectrom. 1996; 25: 245.
9. Markowicz AA, Van Grieken RE. Quantification in XRF analysis of intermediate-thickness samples. In Handbook of X-ray Spectrometry, Markowicz A A, Van Grieken RE (eds). Marcel Dekker: New York, 2002; 407.
10. Sitko R. X-Ray Spectrom. 2005; 34:11.
11. Sitko R. X-ray Spectrom. 2006; 35: 93.
12. Wernish J, Pohn C, Hanke W, Ebel E. X-ray Spectrom. 1984; 13: 180.
13. McMaster WH, Del Grande NK, Mallett JH, Hubbell JH. Compilation of X-ray Cross Sections, Lawrence Livermore National Laboratory, Report UCRL-50174, Sec. II, Rev. 1, Livermore, 1969.
14. Elam WT, Ravel BD, Sieber JR. Radiat. Phys. Chem. 2001; 63: 121.
15. Hubbell JH, Trehan PN, Singh N, Chand B, Mehta D, Garg ML, Garg RR, Singh S, Puri S. J. Phys. Chem. Ref. Data 1994; 23: 339.
16. Salem SI, Panossian SL, Krause RA. At. Data Nucl. Data Table 1974; 14: 92.
17. Lachance GR, Traill RJ. Can. Spectrosc. 1966; 11: 43.
18. Claisse F, Quintin M. Can. Spextrosc. 1967; 12:129.
19. Rousseau RM, Claisse F. X-ray Spektrom. 1974; 3: 31.