Orientation relationships of martensite variants determined by electron backscatter diffraction

Micron

Volumn 31, Issue 1, 2000, Pages 17-25

  Chen, Xiaomei ^a   Gui, Jianian ^a   Wang, Renhui ^a,b   Wang, Jianbo ^a,b   Liu, Jing ^a,c   Chen, Fangyu ^c   Wang, Dahai ^a  

^a WUHAN UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c WUHAN IRON AND STEEL GROUP CORPORATION   (China)

Author keywords

Electron backscatter diffraction; Martensite variants; Orientation relationship; Shape memory alloy

Indexed keywords

EID: 0033990274     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00060-8     Document Type: Article

References (13)

1. Alam M.N., Blackman M., Pashley D.W. High-angle Kikuchi patterns. Proceedings of the Royal Society. 221:1954;224-242.
2. Dingley D.J. Diffraction from sub-micron areas using electron backscattering in a scanning electron microscopy. Scanning Electron Microscopy. 2:1984;569-575.
3. Dingley D.J., Baba-Kishi K.Z., Randle V. Atlas of Backscattering Kikuchi Diffraction Patterns. 1995;Institute of Physics Publishing, Bristol.
4. Juul Jensen D., Schmidt N.H. Local texture measurements by EBSP: new computer procedures. Textures and Microstructures. 14-18:1991;97-102.
5. Kikuchi S. Diffraction of cathode rays by micra. Japanese Journal of Physics. 5:1928;83-96.
6. Miyazaki S., Otsuka K. Development of shape memory alloys. ISIJ International. 29:1989;353-377.
7. Randle V. Microtexture Determination and its Application. 1992;Institute of Materials, London.
8. Randle V. Measurement of Grain Boundary Geometry. 1993;IOP, Bristol.
9. Saburi T., Nenno S. The shape memory effect and related phenomena. Aaronson H.I., Laughlin D.E., Sekerka R.E., Wayman C.M. Proceedings of the International Conference on Solid→Solid Phase Transformations. 1981;1455-1479.
10. Saburi T., Wayman C.M. Crystallographic similarities in shape memory martensite. Acta Metallurgica. 27:1979;979-995.
11. Schwarzer R.A. Automated crystal lattice orientation mapping using a computer-controlled SEM. Micron. 28:1997;249-265.
12. Venables J.A., Harland C.J. Electron back-scattering patterns - a new technique for obtaining crystallographic information in the SEM. Philosophical Magazine. 27:1973;1193-1200.
13. Wright S.I., Zhao J., Adams B.L. Automated determination of lattice orientation from electron backscattered Kikuchi diffraction patterns. Textures and Microstructures. 13:1991;123-131.