Strain-induced relaxor behavior in PbSc0.50Nb 0.25Ta0.25O3 thin films: A comparison with nanoceramics

Journal of the American Ceramic Society

Volumn 91, Issue 6, 2008, Pages 1788-1795

  Correa, Margarita ^a   Kumar, Ashok ^a   Katiyar, Ram S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL ACOUSTICS; DIELECTRIC PROPERTIES; LITHOGRAPHY; SPECTRUM ANALYSIS;

(PL) PROPERTIES; COMPARATIVE STUDIES; MICRO-RAMAN SPECTROSCOPY (MRS); RELAXOR BEHAVIORS;

DIELECTRIC SPECTROSCOPY;

EID: 44649187385     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2008.02406.x     Document Type: Article

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