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Volumn 23, Issue 2, 2008, Pages 146-149

Handy waveguide TXRF spectrometer for nanogram sensitivity

Author keywords

Incident X ray beam; Portable spectrometer; TXRF; Waveguide; X ray fluorescence

Indexed keywords

3D TRANSITION METALS; LINE EXCITATION; NANOGRAMS; SIGNAL-TO-BACKGROUND RATIO; TXRF; X RAY BEAM; X RAY FLUORESCENCE;

EID: 44649147298     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2919826     Document Type: Article
Times cited : (11)

References (19)
  • 5
    • 84876633923 scopus 로고    scopus 로고
    • Bench toX-ray fluorescence spectrometers based on orthogonal and total reflection geometry for excitation,", Alghero, Italy, June 2004.
    • Jiḿnez, R. E. A. (2004). " Bench top X-ray fluorescence spectrometers based on orthogonal and total reflection geometry for excitation.," European Conference on X-ray Spectrometry, Alghero, Italy, June 2004.
    • (2004) European Conference on X-ray Spectrometry
    • Jiḿnez, R.E.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.