Scanning gate study of organic thin-film field-effect transistor

Journal of Physics: Conference Series

Volumn 109, Issue 1, 2008, Pages

  Aoki, N ^a   Sudou, K ^a   Matsusaki, K ^a   Okamoto, K ^a   Ochiai, Y ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44649120891     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/109/1/012007     Document Type: Article

References (8)

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