Information on in- and out-of-plane correlated roughness in multilayers from x-ray specular reflectivity

Journal of Physics D: Applied Physics

Volumn 41, Issue 11, 2008, Pages

  Romanov, V P ^a   Ulyanov, S V ^a   Uzdin, V M ^a   Nowak, G ^b   Vadala, M ^b   Zabel, H ^b  

^a ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG REFLECTORS; COMPUTER SIMULATION; DEBYE TEMPERATURE; SCATTERING; SURFACE ROUGHNESS; X RAY SCATTERING;

BRAGG PEAKS; DEBYE-WALLER FACTOR; INTERFACIAL ROUGHNESS; KIESSIG FRINGES; X-RAY SPECULAR REFLECTIVITY;

MULTILAYERS;

EID: 44449148714     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/11/115401     Document Type: Article

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