X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. II. Diffuse scattering

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 22, 2003, Pages

  Lee, D R ^a   Sinha, S K ^b,c   Nelson, C S ^a,e   Lang, J C ^a   Venkataraman, C T ^a   Srajerv, G ^a   Osgood, R M ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ENERGY; FILM; MAGNETIC FIELD; MATHEMATICAL ANALYSIS; MATHEMATICAL PARAMETERS; PHOTON; POLARIZATION; RADIATION SCATTERING; X RAY;

EID: 0742305046     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.224410     Document Type: Article

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