First X-ray fluorescence excited Kossel diffraction in SEM

Microchimica Acta

Volumn 161, Issue 3-4, 2008, Pages 455-458

  Langer, Enrico ^a   Haschke, Michael ^b   Däbritz, Siegfried ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b IfG Institute for Scientific Instruments GmbH   (Germany)

Author keywords

Kossel technique; Lattice source interferences; Laue method; Polycapillary lens; X ray fluorescence analysis

Indexed keywords

EID: 44449109146     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-007-0906-9     Document Type: Conference Paper

References (14)

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