Investigation of the Three-Dimensional Microstructure of Cu-Sn(Pb) Diffusion Zones by Means of Ion Beam Sputtering, Scanning Electron Microscopy and Lattice Source Interferences

Mikrochimica Acta

Volumn 125, Issue 1, 1997, Pages 3-12

  Däbritz, Siegfried ^a   Hauffe, Wolfgang ^a   Kurt, Ralph ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Cu3Sn; Cu41Sn11; Cu6Sn5; Diffusion; Electron probe microanalysis; Ion beam sputtering; Kossel technique; Scanning electron microscopy

Indexed keywords

EID: 0345353858     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01246155     Document Type: Article

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