New observation method for divergent beam X-ray diffraction patterns

Journal of analytical atomic spectrometry

Volumn 14, Issue 3, 1999, Pages 409-412

  Däbritz, Siegfried ^a   Langer, Enrico ^a   Hauffe, Wolfgang ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; ELECTROMAGNETIC WAVE REFLECTION; IMAGE PROCESSING; SCANNING ELECTRON MICROSCOPY;

DIVERGENT BEAM X RAY DIFFRACTION METHOD;

X RAY DIFFRACTION ANALYSIS;

EID: 0345359020     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a806922k     Document Type: Article

References (9)

1. T. Cog, D. Bahr and G. Materlik, Phys. Rev. B, 1995, 51, 6761.
2. T. Takahashi and M. Takahasi, Jpn. J. Appl. Phys., 1993, 32, 5159.
3. Ch. Schetlich, S. Brenner and V. Geist, J. Synchrotron Radiat., 1998, 5, 102.
4. T. Ellis, F. Nanni, A. Shrier, S. Weissmann, G. E. Padawer and N. Hosokawa, J. Appl. Phys., 1964, 35, 11.
5. D. J. Dingley and N. Razavizadeh, in Scanning Electron Microscopy, ed. O. Johari, AME O. I. L. Hare, Illinois, 1981, vol. IV, p. 287.
6. S. Däbritz, H. Horn, K. Kleinstück, H. Waltinger and V. Hoffmann, Cryst. Res. Technol., 1986, 12, 1531.
7. S. Däbritz, E. Langer and W. Hauffe, Fresenius' J. Anal. Chem., 1997, 358, 148.
8. E. Langer, S. Däbritz, A. Röder and W. Hauffe, Fresenius' J. Anal. Chem, 1999, in the press.
9. E. Langer, R. Kurt and S. Däbritz, unpublished work.