SCOPUS 정보 검색 플랫폼

Mikrochimica Acta

Volumn 138-139, Issue 138/3-4,139/1-4, 2002, Pages 105-113

Improving matrix corrections

(1) Joy, David C a

a UNIVERSITY OF TENNESSEE (United States)

Author keywords

Backscatter yield; Electron stopping power; Fluorescent yield; Ionization cross section; Mass absorption

Indexed keywords

ATOMIC PARTICLE; CALCULATION; CHEMICAL ANALYSIS; CONFERENCE PAPER; ELECTRON MICROSCOPY; ELECTRON PROBE MICROANALYSIS; ENERGY; FLUORESCENCE; MOLECULAR DYNAMICS; X RAY ANALYSIS;

EID: 0036318236 PISSN: 00263672 EISSN: None Source Type: Journal
DOI: 10.1007/s006040200017 Document Type: Conference Paper

Times cited : (3)

References (20)

1
- 0003984405
- (2001) A Database of Electron-Solid Interactions
- Joy, D.C.¹

2
- 0009783030
- Van Nostrand, NY
- (1981) Electron Probe Microanalysis
- Heinrich, K.F.J.¹

3
- 0003539132
- Plenum Press, New York
- (1992) Scanning Electron Microscopy and X-Ray Microanalysis, 2nd Edn.
- Goldstein, J.¹ Newbury, D.E.² Echlin, P.E.³ Joy, D.C.⁴ Lifshin, E.⁵

4
- 0001564477
- (1930) Ann. Phys. , vol.5 , pp. 325
- Bethe, H.A.¹

5
- 0003831454
- Nuclear Science Series Report #39, NAS-NRC Publication 1133. Natl. Acad. Sci., Washington DC
- (1964) Studies in the Penetration of Charged Particles in Matter , pp. 205
- Berger, M.J.¹ Seltzer, S.M.²

6
- 84984051858
- (1989) Scanning , vol.11 , pp. 176
- Joy, D.C.¹ Luo, S.²

7
- 0015021232
- (1971) J. Appl. Phys. , vol.42 , pp. 1149
- Garber, F.W.¹ Nakai, M.Y.² Harter, J.A.³ Bikhoff, R.D.⁴

8
- 0020848048
- (1983) J. Phys. D: Appl. Phys. , vol.16 , pp. 2257
- Al-Ahmad, K.O.¹ Watt, D.E.²

9
- 84963253669
- (1991) Rad. Effects and Defects in Solids , vol.117 , pp. 235
- Luo, S.¹ Zhang, X.² Joy, D.C.³

10
- 0030316889
- (1996) Scanning Microscopy , vol.10 , pp. 653
- Joy, D.C.¹ Luo, S.² Gauvin, R.³ Hovington, P.⁴ Evans, N.⁵

11
- 0009758976
- Report #37 to The International Committee on Radiation Units. ICRU, Bethesda, MD
- (1983) Stopping Powers of Electrons and Positrons

12
- 0001794335
- K. F. J. Heinrich (Ed.) NBS Special Publication 298
- (1968) Quantitative Electron Probe Microanalysis , pp. 133
- Duncumb, P.¹ Reed, S.J.B.²

13
- 0009783299
- (1935) Phys. Rev. , vol.48 , pp. 30
- Clark, E.¹

14
- 0000959566
- (1986) Phys. Rev. , vol.A34 , pp. 2488
- Quarles, C.A.¹ Estep, L.²

15
- 0002725115
- (1976) Rev. Mod. Phys. , vol.48 , pp. 33
- Powell, C.J.¹

16
- 36049058271
- (1966) Rev. Mod. Phys. , vol.38 , pp. 513
- Fink, R.W.¹ Jopson, R.C.² Mark, H.³ Swift, C.D.⁴

17
- 0009080694
- (1972) Rev. Mod. Phys. , vol.44 , pp. 716
- Bambynek, W.¹ Crasemann, B.² Fink, R.W.³ Freund, H.-U.⁴ Mark, H.⁵ Swift, C.D.⁶ Price, R.E.⁷ Rao, P.V.⁸

18
- 0042079626
- (1968) Brit. J. Appl. Phys. (J. Phys. D) , vol.1 , pp. 425
- Green, M.¹ Cosslett, V.E.²

19
- 0009760290
- D. R. Beaman, R. E. Ogilvie, D. B. Wittry (Eds.) Pendell Publ., Midland, MI
- (1977) Proc. 8th IXCOM Conference Boston 1977 , pp. 141
- Lifshin, E.¹ Ciccarelli, M.E.² Bolon, R.³

20
- 0031831370
- (1998) J. Microsc. , vol.191 , pp. 74
- Joy, D.C.¹

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