Surface investigations of bonded perfluoro polyether monolayers on gold surfaces

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 1210-1213

  Alamarguy, D ^a   Noel S ^b   Schneegans, O ^b   Meyer, R ^b   Tristani, L ^a   Di Meo, A ^c  

^a FCI Corporate Research Center   (France)

^b UNIV PARIS SUD   (France)

^c Solvay Solexis   (Italy)

Author keywords

Atomic force microscopy; Electrical properties; Grafting; Perfluoro polyether; Self assembled monolayer

Indexed keywords

GRAFTING; ORGANIC THIN FILMS; PERFLUORO POLYETHERS; SELF-ASSEMBLED MONOLAYERS;

AGING OF MATERIALS; ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ELECTRODEPOSITION; GOLD; MONOLAYERS; SELF ASSEMBLY; SPECTROMETERS; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYETHERS;

EID: 4444356612     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1878     Document Type: Conference Paper

References (5)

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4. Alamarguy D, Schneegans O, Noël S, Boyer L. 21st International Conference on Electrical Contact, Zurich, Switzerland, Sept. 2002.
5. Mate CM. IBM J. Res. Develop. 1995; 39(6): 617.