Structural, morphology and electrical studies of Sm-modified bismuth titanate thin films on Si (100)

Journal of Solid State Chemistry

Volumn 177, Issue 9, 2004, Pages 3021-3027

  Liu, W L ^a,b   Xia, H R ^a   Han, H ^c   Wang, X Q ^a  

^a SHANDONG UNIVERSITY   (China)

^b QILU UNIVERSITY OF TECHNOLOGY   (China)

^c UNIVERSITY OF ALABAMA   (United States)

Author keywords

73.40; 77.55; 77.80; 81.20; Crystal structure; Electrical properties; Ferroelectrics; Nanomaterials

Indexed keywords

BISMUTH TITANATE; DISSIPATION FACTOR;

ANNEALING; ENERGY DISSIPATION; FERROELECTRIC MATERIALS; ORGANOMETALLICS; SAMARIUM; SCANNING ELECTRON MICROSCOPY; SPIN COATING; STRUCTURAL ANALYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BISMUTH COMPOUNDS;

BISMUTH DERIVATIVE; BISMUTH TITANATE; SAMARIUM; SILICON; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL MODIFICATION; CRYSTAL STRUCTURE; DECOMPOSITION; DIELECTRIC CONSTANT; ELECTRIC POTENTIAL; ELECTRICAL PARAMETERS; FILM; MATERIAL COATING; MEASUREMENT; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SUBSTITUTION REACTION; TEMPERATURE; X RAY DIFFRACTION;

EID: 4444291535     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jssc.2004.05.016     Document Type: Article

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