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Physica Status Solidi (A) Applied Research

Volumn 201, Issue 10, 2004, Pages 2390-2393

Characterization of fullerene-like CNx thin films deposited by pulsed-laser ablation of graphite in nitrogen

(7) Riascos, H a,b Zambrano, G b Prieto, P b Devia, A c Galindo, H d Power, C d Gonzalez J d

a UNIVERSIDAD TECNOLÓGICA DE PEREIRA (Colombia)

b UNIVERSIDAD DEL VALLE (Colombia)

c UNIVERSIDAD NACIONAL DE COLOMBIA (Colombia)

d UNIVERSIDAD DE LOS ANDES (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; FULLERENES; GRAPHITE; INFRARED SPECTROSCOPY; NITROGEN; PRESSURE EFFECTS; PULSED LASER DEPOSITION; PYROLYSIS; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

BOND STRUCTURE; CARBON BONDING RATIO; ISOCYANIDES;

THIN FILMS;

EID: 4444283214 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/pssa.200304903 Document Type: Conference Paper

Times cited : (7)

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