![]() |
Volumn 16, Issue 33, 2004, Pages
|
Advanced materials analysis using synchrotron radiation and its application in engineering science
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CERIUM NITRATE;
HYDROGEN STORAGE ALLOYS;
SOLID-STATE DETECTOR;
ZIRCONYL NITRATE SOLUTION;
AMORPHOUS FILMS;
CERIUM COMPOUNDS;
CRYSTAL STRUCTURE;
FLUORESCENCE;
SYNCHROTRON RADIATION;
THIN FILM DEVICES;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
X RAYS;
ZIRCONIUM COMPOUNDS;
MATERIALS SCIENCE;
|
EID: 4444275703
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/16/33/014 Document Type: Conference Paper |
Times cited : (3)
|
References (12)
|