Identification of emissive interface-related defects in polyfluorene-based light emitting devices

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 7 A, 2004, Pages

  Gamerith, Stefan ^a,d   Nothofer, Heinz Georg ^b,c   Scherf, Ullrich ^b,c   List, Emil J W ^a,d  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b Sony Deutschland GmbH   (Germany)

^c UNIVERSITY OF WUPPERTAL   (Germany)

^d Institute of Nanostructured Materials and Photonics   (Austria)

Author keywords

Chemical defect; Conducting polymer; Interface; Polyfluorene; Polymer light emitting diodes (PLEDs)

Indexed keywords

CHEMICAL DEFECT; CONDUCTING POLYMER; POLYFLUORENE; POLYMER LIGHT EMITTING DIODES (PLED);

ACOUSTIC EMISSIONS; ALKALINE EARTH METALS; ALUMINUM COMPOUNDS; CATHODES; CHEMICAL REACTIONS; DEFECTS; DEPOSITION; ELECTRIC POTENTIAL; HEAT CONDUCTION; INTERFACES (MATERIALS); LIGHT EMITTING DIODES;

POLYMERS;

EID: 4444222251     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.L891     Document Type: Article

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