MLC quality assurance using EPID: A fitting technique with subpixel precision

Medical Physics

Volumn 35, Issue 6, 2008, Pages 2347-2355

  Mamalui Hunter, Maria ^a   Li, Harold ^a   Low, Daniel A ^a  

^a WASHINGTON UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

EPID; IMRT; Lorentzian fitting; MLC QA

Indexed keywords

ABUTMENTS (BRIDGE); AMORPHOUS SILICON; BIOMEDICAL ENGINEERING; CALIBRATION; HEURISTIC ALGORITHMS; MULTIOBJECTIVE OPTIMIZATION; QUALITY ASSURANCE; STATISTICS;

EPID; IMRT; LORENTZIAN FITTING; LORENTZIAN FUNCTIONS; MLC QA; MULTILEAF COLLIMATORS; POSITIONING ACCURACY; SILICON-BASED ELECTRONICS;

PIXELS;

SILICON DIOXIDE;

ACCURACY; ARTICLE; CALCULATION; CALIBRATION; COLLIMATOR; ELECTRONIC PORTAL IMAGING DEVICE; IMAGE ANALYSIS; IMAGING; NOISE; NORMAL DISTRIBUTION; PRIORITY JOURNAL; QUALITY CONTROL; RELIABILITY;

EID: 44349184939     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2919560     Document Type: Article

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