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Volumn 31, Issue 7, 2004, Pages 2091-2096

Use of EPID for leaf position accuracy QA of dynamic multi-leaf collimator (DMLC) treatment

Author keywords

DMLC QA; EPID; IMRT

Indexed keywords

AMORPHOUS SILICON; DOSIMETRY; DYNAMICS; ENERGY GAP; IMAGE ANALYSIS; QUALITY ASSURANCE;

EID: 3142693958     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1760187     Document Type: Article
Times cited : (53)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.