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Volumn 43, Issue 13, 2008, Pages 4631-4643

Photographing impact of plasma-sprayed particles on rough substrates

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; PLASMA SPRAYING; PYROMETERS; SILICON WAFERS; TEMPERATURE DISTRIBUTION;

EID: 44349174240     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-008-2669-z     Document Type: Conference Paper
Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.