Identification of the SiF6 2- dianion by accelerator mass spectrometry and a fully relativistic computation of its photodetachment spectrum

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 77, Issue 5, 2008, Pages

  Gnaser, Hubert ^a   Golser, Robin ^b   Pernpointner, Markus ^c   Forstner, Oliver ^b   Kutschera, Walter ^b   Priller, Alfred ^b   Steier, Peter ^b   Wallner, Anton ^b  

^a University of Koblenz Landau   (Germany)

^b UNIVERSITY OF VIENNA   (Austria)

^c UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOELECTRON SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SILICON COMPOUNDS; SPUTTERING;

ACCELERATOR MASS SPECTROMETRY; DIANION; MASS TO CHARGE RATIO; PHOTODETACHMENT SPECTRUM;

NEGATIVE IONS;

EID: 44349113577     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.77.053203     Document Type: Article

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