메뉴 건너뛰기




Volumn 74, Issue 11, 2007, Pages 545-552

Deflectometric reconstruction of partially specular free-form surfaces;Deflektometrische Rekonstruktion teilspiegelnder Freiformflächen

Author keywords

3d reconstruction; Deflectometry; Inverse problems; Shape from shading

Indexed keywords

3D RECONSTRUCTION; ADDITIONAL KNOWLEDGE; CHARACTERISTIC CURVE; DEFLECTOMETRY; DIFFUSE REFLECTION; FREE-FORM SURFACE; SHAPE FROM SHADING; SURFACE POINTS;

EID: 44049092751     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: 10.1524/teme.2007.74.11.545     Document Type: Article
Times cited : (5)

References (14)
  • 3
    • 85026012120 scopus 로고    scopus 로고
    • Automatische Inspektion spiegelnder Oberflächen anhand von Rasterreflexion.
    • S
    • J. Beyerer und D. Pérard: Automatische Inspektion spiegelnder Oberflächen anhand von Rasterreflexion. In: tm-Technisches Messen 64 (1997), S. 394-400.
    • (1997) tm-Technisches Messen , vol.64 , pp. 394-400
    • Beyerer, J.1    Pérard, D.2
  • 4
    • 57649216966 scopus 로고    scopus 로고
    • D. Pérard und J. Beyerer: Three-dimensional measurement of free-form surfaces with a structured-light reflection technique. In: Proceedings of the SPIE Three-Dimensional Imaging and Laser- based Systems for Metrology and Inspection III (1997), Nr. 3204, S. 75-80.
    • D. Pérard und J. Beyerer: Three-dimensional measurement of free-form surfaces with a structured-light reflection technique. In: Proceedings of the SPIE Three-Dimensional Imaging and Laser- based Systems for Metrology and Inspection III (1997), Nr. 3204, S. 75-80.
  • 6
    • 21844470667 scopus 로고    scopus 로고
    • Deflektometrie zur Qualitätsprüfung spiegelnd reflektierender Oberflächen.
    • S
    • S. Kammel: Deflektometrie zur Qualitätsprüfung spiegelnd reflektierender Oberflächen. In: tm - Technisches Messen 70 (2003) Nr. 4, S. 394-400.
    • (2003) tm - Technisches Messen , vol.70 , Issue.4 , pp. 394-400
    • Kammel, S.1
  • 8
    • 10044239303 scopus 로고    scopus 로고
    • Phase measuring deflectometry: A new approach to measure specular free-form surfaces
    • S
    • M. Knauer, J. Kaminski und G. Häusler :Phase measuring deflectometry: a new approach to measure specular free-form surfaces. In: Optical Metrology in Production Engineering (2004) Nr. 5457, S. 366-376.
    • (2004) Optical Metrology in Production Engineering , Issue.5457 , pp. 366-376
    • Knauer, M.1    Kaminski, J.2    Häusler, G.3
  • 10
    • 33745864035 scopus 로고    scopus 로고
    • Rasterreflexions-Photogrammetrie zur Messung spiegelnder Oberflächen.
    • S
    • M. Petz: Rasterreflexions-Photogrammetrie zur Messung spiegelnder Oberflächen. In: tm - Technisches Messen 71 (2004) Nr. 7-8, S. 389-397.
    • (2004) tm - Technisches Messen , vol.71 , Issue.7-8 , pp. 389-397
    • Petz, M.1
  • 14
    • 37149011715 scopus 로고    scopus 로고
    • Automatische Inspektion spiegelnder Oberflächen mittels inverser Muster.
    • S
    • S. Werling und J. Beyerer: Automatische Inspektion spiegelnder Oberflächen mittels inverser Muster. In:tm - Technisches Messen 74 (2007) Nr. 4, S. 217-223.
    • (2007) tm - Technisches Messen , vol.74 , Issue.4 , pp. 217-223
    • Werling, S.1    Beyerer, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.