Reflection grating photogrammetry for the measurement of specular surfaces;Rasterreflexions-photogrammetrie zur messung spiegelnder oberflächen

Technisches Messen

Volumn 71, Issue 7-8, 2004, Pages 389-397

  Petz, Marcus ^a   Tutsch, Rainer ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

Deflectometry; Photogrammetry; Reflection grating method; Specular surfaces

Indexed keywords

CONTACT LESS; DEFLECTOMETRY; FREE-FORM SURFACE; OPTICAL MEASUREMENT TECHNIQUES; REFLECTION GRATINGS; SPECULAR REFLECTING; SPECULAR SURFACE; THREE-DIMENSIONAL MEASUREMENTS;

MEASUREMENTS; OPTICAL DATA PROCESSING;

PHOTOGRAMMETRY;

EID: 33745864035     PISSN: 01718096     EISSN: 01718096     Source Type: Journal    
DOI: 10.1524/teme.71.7.389.36694     Document Type: Article

References (10)

1. Th. Luhmann: Nahbereichsphotogrammetrie: Grundlagen, Methoden und Anwendungen. Heidelberg 2000.
2. J. Thesing: Neue Bildpunktoperatoren zur Konturerfassung mittels projizierter Streifen. Dissertation, Technische Universität Braunschweig 1999.
3. R. Ritter, R. Hahn: Contribution to Analysis of the Reflection Grating Method. In: Optics and Lasers in Engineering, Vol. 4 (1983), No. 1, S. 33-44.
4. M. Petz, R. Ritter: Reflection grating method for 3D measurement of reflecting surfaces. In: R. Höfling, W. Jüptner, M. Kujawinska (eds.): Proceedings of SPIE Vol. 4399 (2001) - Optical Measurement for Industrial Inspection II: Applications in Production Engineering, S. 35-41.
5. M. Petz, R. Tutsch: Optical 3D Measurement of Reflecting Free Formed Surfaces. In: VDI-Berichte 1694, International Symposium on Photonics in Measurement, Aachen 2002, S. 329-332.
6. C. Reich: Vollständige optische Formerfassung durch photogrammetrische Verknüpfung von Teilflächen. Dissertation, Technische Universität Braunschweig 1999.
7. W. Osten: Digitale Verarbeitung und Auswertung von Interferenzbildern. Berlin 1991, S. 124-146.
8. F.M. Wahl: A Coded Light Approach for Depth Map Acquisition. In: G. Hartmann, (ed.): 8. DGAM Symposium, Informatik-Fachberichte 125, Berlin 1986, S. 12-17.
9. C. Reich, R. Ritter, J. Thesing: White light heterodyne principle for 3D-measurement. In: O. Loffeld (ed.): Proceedings of SPIE Vol. 3100 (1997) - Sensors, Sensor Systems and Sensor Data Processing, S. 236-244.
10. R. Ritter: Deformation measurement by optical field methods in material testing and for verification of numerical simulation. In: P.K. Rastogi (ed.): Proc. International Conference on applied optical metrology, 1998, S. 24-33.